| US 7,602,505 B2 | ||
| Method for the automatic parameterization of measuring systems | ||
| Thomas Kaltenbach, Gutach-Siegelau (Germany) | ||
| Assigned to Sick AG, Waldkirch/Breisgau (Germany) | ||
| Filed on Nov. 15, 2006, as Appl. No. 11/600,322. | ||
| Claims priority of application No. 10 2005 054 658 (DE), filed on Nov. 16, 2005. | ||
| Prior Publication US 2007/0121122 A1, May 31, 2007 | ||
| Int. Cl. G01B 11/14 (2006.01) | ||
| U.S. Cl. 356—601 [356/625; 356/3.07; 382/154; 250/559.05] | 12 Claims |
| 1. A method for automatic parameterization of measuring systems for the measurement of objects transported by means of a transport
device (11), comprising:
moving a test object through a measuring zone of the measuring system;
sequentially detecting a plurality of images of the test object;
determining a transport speed of the transport device from the plurality of images, wherein at least one of a contour (25, 27) gained from the plurality of the images and an angle of the test object (19) is compared with a corresponding at least one of a known actual contour and a known angle of the test object (19) for the determination of the transport speed;
detecting at least one image using a sensor for electromagnetic radiation, wherein said at least one image is at least one-dimensional
and comprises picture elements (17) of the test object (19) known at least in part to the measuring system with respect to its dimensions and located in a measuring zone of the measuring
system;
determining parameters associated with the sensor which are required for the measurement of objects from the image and the
known dimensions of the test object (19); and
storing the parameters in a memory device of the measurement system.
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