| US 7,602,200 B2 | ||
| Probe for electrical test comprising a positioning mark and probe assembly | ||
| Yuji Miyagi, Aomori (Japan); and Tetsuya Iwabuchi, Aomori (Japan) | ||
| Assigned to Kabushiki Kaisha Nihon Micronics, Musashino-shi, Tokyo (Japan) | ||
| Appl. No. 12/160,199 PCT Filed Mar. 15, 2006, PCT No. PCT/JP2006/305631 § 371(c)(1), (2), (4) Date Jul. 07, 2008, PCT Pub. No. WO2007/108110, PCT Pub. Date Sep. 27, 2007. |
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| Prior Publication US 2009/0009201 A1, Jan. 08, 2009 | ||
| Int. Cl. G01R 31/02 (2006.01) | ||
| U.S. Cl. 324—754 [324/758] | 10 Claims |
| 1. A probe for electrical test, characterized in that a positioning mark is provided on a second plane that is parallel to
a first plane, the first plane provided with a tip, said second plane being directed in the same direction as said first plane,
said second plane located at a height position lower than said tip and lower than said first plane, and further characterized
in that the positioning mark contains information indicating the existing direction of the tip when the positioning mark is
observed from the projecting direction of the tip, the probe comprising:
a seat portion having a mounting face configured for mounting to a support plate, the seat portion extending from said mounting
face to a top of the seat portion;
an arm portion extending laterally from the top of the seat portion; and
a front end portion projecting from said arm portion to the opposite side of the side where said mounting face of the seat
portion is positioned, wherein said tip is provided in said front end portion and said positioning mark is provided at said
front end portion of said arm portion, wherein said positioning mark has two mark parts formed at an interval from each other
in the longitudinal direction of said arm portion and wherein both mark parts have different width dimensions along the longitudinal
direction of said arm portion.
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