| US 7,600,156 B2 | ||
| System, method, and device including built-in self tests for communication bus device | ||
| Bryan J. Thornley, Georgetown, Tex. (US); Craig Chaiken, Pflugerville, Tex. (US); Vinod Makhija, Austin, Tex. (US); and Andrew O'Rourke, Cedar Park, Tex. (US) | ||
| Assigned to Dell Products, LP, Round Rock, Tex. (US) | ||
| Filed on Dec. 19, 2006, as Appl. No. 11/612,823. | ||
| Prior Publication US 2008/0148101 A1, Jun. 19, 2008 | ||
| Int. Cl. G06F 11/00 (2006.01) | ||
| U.S. Cl. 714—43 | 20 Claims |
| 1. A method of testing an electronic device, the method comprising:
accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling
system;
detecting a self-test descriptor associated with the configuration descriptor;
testing a portion of the first device using test information associated with the self-test descriptor;
scanning a communication bus of the information handling system;
detecting the first device is coupled to the communication bus during the scanning;
sending a request to read the configuration descriptor;
parsing the self-test descriptor and the configuration descriptor; and
enabling a test mode after parsing the self-test descriptor and the configuration descriptor.
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