| US 7,598,993 B2 | ||
| Imaging apparatus and method capable of reading out a plurality of regions | ||
| Kouki Abe, Hino (Japan); Takashi Kumazawa, Hino (Japan); Sei Makino, Hino (Japan); and Junji Kishi, Hino (Japan) | ||
| Assigned to Toshiba Teli Corporation, Hino-shi, Tokyo (Japan) | ||
| Filed on Dec. 13, 2004, as Appl. No. 11/11,014. | ||
| Application 11/011014 is a continuation of application No. PCT/JP03/03732, filed on Mar. 26, 2003. | ||
| Claims priority of application No. 2002-172794 (JP), filed on Jun. 13, 2002. | ||
| Prior Publication US 2005/0094010 A1, May 05, 2005 | ||
| Int. Cl. H04N 3/14 (2006.01) | ||
| U.S. Cl. 348—302 | 2 Claims |

| 1. An imaging apparatus for use in an inspection machine which inspects the configuration of plural parts on a substrate,
the apparatus comprising:
an imaging region having a plurality of X-address lines and a plurality of Y-address lines formed thereon, a plurality of
pixels being formed near the intersections of the X-address lines and the Y-address lines, each pixel having an independent
address, wherein the imaging region provides each pixel with a reading address;
a first Y-register and a second Y-register to select an arbitrary line out of said plurality of Y-address lines;
a first X-register and a second X-register to select an arbitrary line out of said plurality of X-address lines;
a sequencer which provides the X- and Y address data for specifying each pixel corresponding regions that correspond to the
configuration positions of the plural parts on the substrate within the imaging region;
a first switch that supplies output address data from the sequencer to the first Y-register or the second Y-register;
a second switch that supplies output address data from the first Y-register or the second Y-register to a plurality of the
plurality of Y-address lines;
a third switch that supplies output address data from the sequencer to the first X-register or the second X-register;
a fourth switch that supplies output address data from the first X-register or the second X-register to a plurality of the
plurality of X-address lines;
an address processor which transfers the address data to the sequencer; and
a memory unit including at least a first memory section having stored therein address data for specifying each pixel in regions
corresponding to first plural parts, and a second memory section having stored therein address data for specifying each pixel
in regions corresponding to second plural parts, as the address data to be given to the address processor, so that a plurality
of substrates, having different configurations of the plural parts mounted thereon, can be inspected.
|