| US 7,598,759 B2 | ||
| Routing engine, method of routing a test probe and testing system employing the same | ||
| Rex W. Pirkle, Denison, Tex. (US); Sean M. Malolepszy, Sherman, Tex. (US); Michael W. Perry, Sherman, Tex. (US); and George Reeves, Sherman, Tex. (US) | ||
| Assigned to Texas Instruments Incorporated, Dallas, Tex. (US) | ||
| Filed on Nov. 07, 2007, as Appl. No. 11/936,689. | ||
| Claims priority of provisional application 60/864717, filed on Nov. 07, 2006. | ||
| Prior Publication US 2008/0106286 A1, May 08, 2008 | ||
| Int. Cl. G01R 31/02 (2006.01) | ||
| U.S. Cl. 324—754 [324/765; 702/118] | 24 Claims |
| 9. A method of routing a test probe for use with a semiconductor wafer, comprising:
analyzing alternative test probe routing sequences that employ representative circuit chips of the semiconductor wafer to
be tested by the test probe;
selecting at least one of the test probe routing sequences as a test probe path for testing the semiconductor wafer based
on a total cost of travel for the test probe path; and guiding the test probe along the test probe path.
|