| US 7,587,647 B2 | ||
| Method for testing analog and mixed-signal circuits using dynamic element matching for source linearization | ||
| Beatriz Olleta, Baltimore, Md. (US); Hanjun Jiang, Ames, Iowa (US); Degang Chen, Ames, Iowa (US); and Randall L. Geiger, Boone, Iowa (US) | ||
| Assigned to Iowa State University Research Foundation, Inc., Ames, Iowa (US) | ||
| Filed on Jul. 30, 2004, as Appl. No. 10/909,105. | ||
| Claims priority of provisional application 60/492087, filed on Aug. 01, 2003. | ||
| Prior Publication US 2005/0057271 A1, Mar. 17, 2005 | ||
| Int. Cl. G06F 11/00 (2006.01) | ||
| U.S. Cl. 714—740 [341/118; 341/120] | 29 Claims |
| 1. A method of testing an analog and/or mixed-signal circuit comprising:
generating an excitation signal for testing using dynamic element matching;
applying the excitation signal to the circuit to provide an output;
characterizing the circuit at least partially based on the output.
|