| US 7,573,664 B2 | ||
| Integrated multiple channel data reliability testing for a magnetic tape drive | ||
| Steven Ross Bentley, Tucson, Ariz. (US); Robert Allen Hutchins, Tucson, Ariz. (US); Demura Masayuki, Kanagawa (Japan); and Shuhei Nadehara, Kawasaki (Japan) | ||
| Assigned to International Business Machines Corporation, Armonk, N.Y. (US) | ||
| Filed on Dec. 03, 2004, as Appl. No. 11/3,224. | ||
| Prior Publication US 2006/0119962 A1, Jun. 08, 2006 | ||
| Int. Cl. G11B 27/36 (2006.01) | ||
| U.S. Cl. 360—31 [360/48; 360/51; 360/53; 360/75; 360/77.12] | 2 Claims |

| 1. Apparatus configured for data reliability testing for a magnetic tape drive configured for parallel recording of data to
multiple tracks, comprising:
a plurality of write channels, each configured to supply separate testing data comprising a unique pattern to each track of
a multiple track parallel tape head for separately writing said separate and unique testing data to each track of a group
of parallel data tracks of a multiple track magnetic tape, and for writing a Synch pattern with said testing data representing
the beginning of a data record;
memory configured to store data representing said separate testing data comprising said unique patterns separately written
to each said parallel track of said group of parallel data tracks;
a plurality of read channels, each configured to read data sensed by a tape head from a parallel track to which said separate
test data was written, said read data corresponding to said separately written test data for said parallel track;
a control state machine configured to respond to a detection of said Synch pattern by at least one of said plurality of read
channels, to pass said corresponding data read from each of said tracks to said error processing logic and to drive a record
and address count to synchronize said memory with said corresponding read data of each parallel track of said group of parallel
tracks;
wherein said error processing logic configured to separately compare and detect differences between said stored separate testing
data comprising said unique patterns of said memory for each of said parallel tracks, and said corresponding data read from
said track of said group of parallel data tracks.
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