| US 7,567,871 B2 | ||
| Automatic material labeling during spectral image data acquisition | ||
| David B. Rohde, Madison, Wis. (US); and Patrick P. Camus, Madison, Wis. (US) | ||
| Assigned to Thermo Electron Scientific Instruments LLC, Madison, Wis. (US) | ||
| Filed on Jul. 27, 2007, as Appl. No. 11/829,518. | ||
| Claims priority of provisional application 60/820537, filed on Jul. 27, 2006. | ||
| Prior Publication US 2008/0027657 A1, Jan. 31, 2008 | ||
| Int. Cl. G01N 31/00 (2006.01); G01R 13/00 (2006.01) | ||
| U.S. Cl. 702—28 [702/30; 702/66; 702/67] | 11 Claims |
| 1. A method for performing spectral microanalysis of a specimen, the method including the steps of:
a. collecting spectra from pixels spaced about a region of interest on the specimen, wherein each spectrum includes emission
counts measured across a range of energies;
b. periodically during the collection:
(1) condensing the collected spectra, wherein the condensing of the collected spectra comprises at least one step selected
from: combining the emission counts in adjacent energy intervals within the range of energies and spatially combining the
spectra in adjacent pixels;
(2) analyzing the condensed spectra while collecting the spectra thus far to determine the probable components present at
the pixels, and
(3) outputting the probable components present at the pixels includes displaying: a. an image of at least some of the pixels
within the region of interest, and b. labels naming the probable components of at least some of the pixels within the region
of interest.
|