| US 7,549,092 B2 | ||
| Output controller with test unit | ||
| Ji-Eun Jang, Kyoungki-do (Korea, Republic of) | ||
| Assigned to Hynix Semiconductor, Inc., Gyeonggi-do (Korea, Republic of) | ||
| Filed on Jun. 30, 2006, as Appl. No. 11/478,078. | ||
| Claims priority of application No. 10-2005-0090888 (KR), filed on Sep. 29, 2005; and application No. 10-2005-0130444 (KR), filed on Dec. 27, 2005. | ||
| Prior Publication US 2007/0070792 A1, Mar. 29, 2007 | ||
| Int. Cl. G11B 5/00 (2006.01) | ||
| U.S. Cl. 714—700 [714/5; 714/707; 714/718; 714/721; 714/731; 714/744; 714/745; 714/814; 365/194; 365/189.16] | 28 Claims |

| 1. An output controller, comprising:
an initial synchronizing unit for outputting a first output enable signal when a read CAS signal is activated;
a plurality of stages of additional synchronizing units, connected in series, each for outputting an output signal of a previous
stage as an output enable signal in synchronization with a corresponding driving clock, a first of the stages receiving the
first output enable signal; and
a test unit for adjusting a delay amount of an input clock according to a plurality of test signals and outputting the driving
clock,
wherein the test unit includes a plurality of delay adjusting units which increase or decrease the delay amount of the input
clock according to a test-delay increment signal, a test-delay decrement signal, and a test-delay normal signal, and output
driving clocks.
|