| US 7,519,490 B2 | ||
| Determining frequency components of jitter | ||
| Michael Panis, Somerville, Mass. (US) | ||
| Assigned to Teradyne, Inc., North Reading, Mass. (US) | ||
| Filed on Jan. 25, 2008, as Appl. No. 12/20,027. | ||
| Application 12/020027 is a division of application No. 11/272027, filed on Nov. 10, 2005, granted, now 7,349,818. | ||
| Prior Publication US 2008/0117960 A1, May 22, 2008 | ||
| Int. Cl. G01R 29/26 (2006.01) | ||
| U.S. Cl. 702—69 | 8 Claims |
| 1. A method of determining frequency components of jitter in a waveform, the method comprising:
strobing a waveform having a repetitive pattern;
forming a locally-in-order strobing scheme of a representative one of the repetitive pattern including subsets of locally-in-order
strobes, wherein the locally-in-order strobings are based on undersampling strobing techniques that map strobes over a relatively
large period of time to effective times within a test pattern;
locating transition regions in the subsets of locally-in-order strobes;
determining random jitter associated for each transition region; and
determining jitter within a specific frequency range.
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