| US 7,490,022 B2 | ||
| System and method for rapid testing of intermittently operated devices | ||
| Abhay Sathe, Fort Collins, Colo. (US); and Stephen D. Janes, Fort Collins, Colo. (US) | ||
| Assigned to Agilent Technologies, Inc., Santa Clara, Calif. (US) | ||
| Filed on Mar. 30, 2005, as Appl. No. 11/93,443. | ||
| Prior Publication US 2006/0241884 A1, Oct. 26, 2006 | ||
| Int. Cl. G06F 15/00 (2006.01) | ||
| U.S. Cl. 702—182 [702/181; 702/108; 455/423; 370/252] | 20 Claims |
| 1. A system for rapid testing of devices, the system comprising:
a test performance component configured for testing an intermittently operated device;
an interface component configured for providing a release interval value and a measurement interval value; and
a test control component configured for receiving the release interval value and the measurement interval value from the interface
component and of providing the release interval value and the measurement interval value to said test performance component;
and
said test performance component being configured for initiating interaction between said intermittently operated device and
said test performance component, of performing a plurality of tests, each test from said plurality of tests occurring over
one measurement interval value, and of terminating said plurality of tests after a predetermined condition is satisfied, all
within an interval specified by the release interval value.
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